Volume 19, Issue 2April 2023Current IssueIssue-in-Progress
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SECTION: Special Issue on CAD for Security: Pre-silicon Security Sign-off Solutions Through Design Cycle Part 2
research-article
On Securing Cryptographic ICs against Scan-based Attacks: A Hamming Weight Distribution Perspective
Scan chain-based Design for Testability is the industry standard in use for testing manufacturing defects in the semiconductor industry to ensure the structural and functional correctness of chips. Fault coverage is significantly enhanced due to the ...
SECTION: Original Papers
research-article
Eternal-thing 2.0: Analog-Trojan-resilient Ripple-less Solar Harvesting System for Sustainable IoT
Recently, harvesting natural energy is gaining more attention than other conventional approaches for sustainable IoT. System on chip power requirement for the internet of things (IoT) and generating higher voltages on chip is a massive challenge for on-...
research-article
AroMa: Evaluating Deep Learning Systems for Stealthy Integrity Attacks on Multi-tenant Accelerators
Multi-tenant applications have been proliferating in recent years, supported by the emergence of computing-as-service paradigms. Unfortunately, multi-tenancy induces new security vulnerabilities due to spatial or temporal co-location of applications with ...